An edition of IWSM (1998)

IWSM: 1998 3rd International Workshop on Statistical Metrology

June 7, 1998, Honolulu

by , , and

Cover of: IWSM: 1998 3rd International Workshop on Statistical Metrology by International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii), IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers
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Last edited by Charles Horn
August 26, 2021 | History
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An edition of IWSM (1998)

IWSM: 1998 3rd International Workshop on Statistical Metrology

June 7, 1998, Honolulu

by , , and

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Publish Date
Publisher
Widerkehr and Associates
Language
English
Pages
121

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Subjects

Semiconductors Congresses Statistical methods Characterization Measurement Engineering measurement & calibration Mathematics for scientists & engineers Technology & Industrial Arts Engineering Statistics Very-Large-Scale Integration (Vlsi) Technology Science/Mathematics Electronics - Semiconductors Mensuration Reference
Edition Availability
Cover of: IWSM
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, IEEE, Widerkehr and Associates
in English
Cover of: Statistical Metrology, 1998 3rd Workshop
Statistical Metrology, 1998 3rd Workshop
July 1998, Institute of Electrical & Electronics Enginee
Paperback in English
Cover of: IWSM: 1998 3rd International Workshop on Statistical Metrology
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, Widerkehr and Associates
Unknown Binding in English

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Book Details

The Physical Object

Format
Unknown Binding
Number of pages
121

Edition Identifiers

Open Library
OL8083153M
ISBN 10
0780343395
ISBN 13
9780780343399

Work Identifiers

Work ID
OL2776376W

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