{"first_publish_date": "1998", "title": "IWSM", "covers": [4720918], "lc_classifications": ["TK7871.85 .I5844 1998"], "key": "/works/OL2776376W", "authors": [{"type": {"key": "/type/author_role"}, "author": {"key": "/authors/OL409029A"}}, {"type": {"key": "/type/author_role"}, "author": {"key": "/authors/OL2858074A"}}, {"type": {"key": "/type/author_role"}, "author": {"key": "/authors/OL251874A"}}], "dewey_number": ["621.3815/2"], "type": {"key": "/type/work"}, "subjects": ["Semiconductors", "Congresses", "Statistical methods", "Characterization", "Measurement", "Engineering measurement & calibration", "Mathematics for scientists & engineers", "Technology & Industrial Arts", "Engineering Statistics", "Very-Large-Scale Integration (Vlsi)", "Technology", "Science/Mathematics", "Electronics - Semiconductors", "Mensuration", "Reference"], "latest_revision": 5, "revision": 5, "created": {"type": "/type/datetime", "value": "2009-12-10T00:23:58.872474"}, "last_modified": {"type": "/type/datetime", "value": "2021-08-26T23:17:09.216388"}}