An edition of IWSM (1998)

IWSM

1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu

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Last edited by MARC Bot
July 17, 2024 | History
An edition of IWSM (1998)

IWSM

1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu

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Publish Date
Language
English
Pages
121

Buy this book

Edition Availability
Cover of: IWSM
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, IEEE, Widerkehr and Associates
in English
Cover of: Statistical Metrology, 1998 3rd Workshop
Statistical Metrology, 1998 3rd Workshop
July 1998, Institute of Electrical & Electronics Enginee
Paperback in English
Cover of: IWSM: 1998 3rd International Workshop on Statistical Metrology
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, Widerkehr and Associates
Unknown Binding in English

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Book Details


Edition Notes

Includes bibliographical references.
"IEEE Catalog Number 98EX113"--verso of T.p.

Published in
Piscataway, New Jersey, Gaithersburg, Maryland
Genre
Congresses.
Other Titles
Workshop on statistical metrology, Statistical metrology

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.85 .I5844 1998

The Physical Object

Pagination
vi, 121 p. :
Number of pages
121

Edition Identifiers

Open Library
OL712633M
ISBN 10
0780343387, 0780343395
LCCN
97080378
OCLC/WorldCat
40383319
Goodreads
3821143

Work Identifiers

Work ID
OL2776376W

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