{"other_titles": ["Workshop on statistical metrology", "Statistical metrology"], "publishers": ["IEEE", "Widerkehr and Associates"], "number_of_pages": 121, "subtitle": "1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu", "isbn_10": ["0780343387", "0780343395"], "pagination": "vi, 121 p. :", "covers": [4720918, 4720902, 3796157, 3796146], "lc_classifications": ["TK7871.85 .I5844 1998"], "key": "/books/OL712633M", "authors": [{"key": "/authors/OL409029A"}], "publish_places": ["Piscataway, New Jersey", "Gaithersburg, Maryland"], "contributions": ["IEEE Electron Devices Society."], "genres": ["Congresses."], "source_records": ["marc:marc_loc_2016/BooksAll.2016.part26.utf8:86690016:1222", "marc:marc_columbia/Columbia-extract-20221130-005.mrc:441347979:4891"], "title": "IWSM", "dewey_decimal_class": ["621.3815/2"], "notes": {"type": "/type/text", "value": "Includes bibliographical references.\n\"IEEE Catalog Number 98EX113\"--verso of T.p."}, "identifiers": {"goodreads": ["3821143"]}, "languages": [{"key": "/languages/eng"}], "lccn": ["97080378"], "subjects": ["Semiconductors -- Characterization -- Statistical methods -- Congresses.", "Semiconductors -- Measurement -- Congresses."], "publish_date": "1998", "publish_country": "nju", "by_statement": "[sponsored by] IEEE Electron Devices Society.", "oclc_numbers": ["40383319"], "works": [{"key": "/works/OL2776376W"}], "type": {"key": "/type/edition"}, "latest_revision": 6, "revision": 6, "created": {"type": "/type/datetime", "value": "2008-04-01T03:28:50.625462"}, "last_modified": {"type": "/type/datetime", "value": "2024-07-17T06:48:36.248940"}}