{"title": "IWSM: 1998 3rd International Workshop on Statistical Metrology ", "subtitle": "June 7, 1998, Honolulu", "publish_date": "1998", "publishers": ["Widerkehr and Associates"], "languages": [{"key": "/languages/eng"}], "isbn_13": ["9780780343399"], "covers": [4720919, 3796158], "physical_format": "Unknown Binding", "isbn_10": ["0780343395"], "type": {"key": "/type/edition"}, "source_records": ["amazon:0780343395"], "key": "/books/OL8083153M", "number_of_pages": 121, "works": [{"key": "/works/OL2776376W"}], "latest_revision": 4, "revision": 4, "created": {"type": "/type/datetime", "value": "2008-04-29T15:03:11.581851"}, "last_modified": {"type": "/type/datetime", "value": "2026-01-05T02:16:59.751349"}}